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‘Hot’ new form of microscopy examines materials using evanescent waves
‘Hot’ new form of microscopy examines materials using evanescent waves

誘電体の熱励起表面波の分光測定に成功(1200_800).jpg

A team of researchers from the Institute of Industrial Science, The University of Tokyo has built a prototype microscope that does not rely on backscattered radiation, instead uses passive detection of thermally excited evanescent waves. They have examined dielectric materials with passive near-field spectroscopy to develop a detection model to further refine the technique, working to develop a new kind of microscopy for examining nanoscopic material surfaces.