Publications Lists of NIHEI Laboratory


Japanese version of this page is here.

1998

  1. "Microarea elemental mapping using gallium focused ion beam-induced Auger electrons", Zh. H. Cheng, T. Sakamoto, M. Takahashi, Y. Kuramoto, M. Owari and Y. Nihei: Bunseki-Kagaku, in press (in Japanese).

  2. "Development of ion and electron dual focused beam apparatus for high spatial resolution three-dimensional microanalysis of solid materials", Zh. H. Cheng, T. Sakamoto, M. Takahashi, Y. Kuramoto, M. Owari and Y. Nihei: J. Vac. Sci. & Technol., in press.

  3. "Development of Three-Dimensional Microanalysis using Ion and Electron Dual Focused Beams", T. Sakamoto, Zh. H. Cheng, M. Takahashi, Y. Kuramoto, M. Owari and Y. Nihei, Bunseki Kagaku, in press (in Japanese).

  4. "Development of an Ion and Electron Dual Focused Beam Apparatus for Three-Dimensional Microanalysis", T. Sakamoto, Zh. H. Cheng, M. Takahashi, M. Owari and Y. Nihei, Jpn. J. Appl. Phys., in press.

  5. "Principles of crystallography using Bragg reflection from atomically localized sourcesn", S. Omori, H. Ishii and Y. Nihei, J. Electron Spectrosc. Relat. Phenom. 88-91, 517-522 (1998).

  6. "Surface Structure of Thin CaO Layers Formed on CaF2(111) studied by Photoelectron Diffraction", H. Ishii, S. Tanigawa, S. Shiraki, T. Nakama, S. Omori, H. Shimada, M. Imamura, N. Matsubayashi, A. Nishijima, Y. Nihei, J. Electron Spectrosc. Relat. Phenom. 88-91, 545-549 (1998).

  7. "Design of Input Lens System for a 180 ° Deflection Toroidal Analyzer using Trajectory Simulation", S. Shiraki, H. Ishii, M. Owari and Y. Nihei, J. Electron Spectrosc. Relat. Phenom. 88-91, 1021-1026 (1998).

  8. "Depth Profiling of Doped Element in a Micro Particle by Ga+ Focused Ion Beam SIMS", B. Tomiyasu, H. Komatsubara, M. Satoh, S. Sakasegawa, M. Owari and Y.Nihei, Secondary ion mass spectrometry SIMS XI, eds. G.Gillen, R. Lareau, J. Bennett and F. Stevie, (John Wiley & Sons, Chichester, 1998) p383-386.

  9. "Ion and Electron Dual Focused Beam Apparatus for Three-Dimensional Microanalysis", T. Sakamoto, Z. Cheng, M. Takahashi, M. Owari and Y. Nihei, Secondary Ion Mass Spectrometry SIMS XI, eds. G.Gillen, R. Lareau, J. Bennett and F. Stevie, (John Wiley & Sons, Chichester, 1998) p691-694.

  10. "Elemental Imaging of Cross-sectioned Individual Particles by Ga+ Focused Ion Beam SIMS", B.Tomiyasu, H.Komatsubara, I. Fukuju, M. Satoh, M. Owari and Y. Nihei, Secondary ion mass spectrometry SIMS XI, eds. G. Gillen, R. Lareau, J. Bennett and F. Stevie, (John Wiley & Sons, Chichester, 1998) p1069-1072.

1997

  1. "Site-specific extinction rule for Kikuchi bands in X-ray photoelectron diffraction", S. Omori, H. Ishii and Y. Nihei, Jpn. J. Appl. Phys., 36, L1689-L1691 (1997).

  2. "Photoelectron Diffraction for the Sulfur Interlayer between Passivated InP(100) and CaF2 Epitaxial Layer and Sulfur-Passivated InP(100)", S. Omori, H. Ishii and Y. Nihei, Appl. Surf. Sci. 191/192, 241-244 (1997).

  3. "Ion and Electron Dual Focused Beam Apparatus for Three-Dimensional Microanalysis", M. Owari, T. Sakamoto, Zh. H. Cheng, M. Takahashi and Y. Nihei, ECASIA'97, eds. I. Olefjord, L. Nyborg and D. Briggs, (John Wiley & Sons, Chichester, 1997) p.1085-1088.

  4. "Microanalysis by Focused Ion Beam Secondary Ion Mass Spectrometry (FIB-SIMS)", Y. Nihei, B. Tomiyasu, T. Sakamoto and M. Owari, J. Trace and Microprobe Techiques, 15(4), 593-599 (1997).

  5. "Photoelectron diffraction studies on the structure of sulfur passivated InP(100) and CaF2 layers grown on S/InP(100)", S. Omori, H. Ishii and Y. Nihei, Surf. Sci. 381, 165-173 (1997).

  6. "Behavior of Gallium Secondary Ion Intensity in Gallium Focused Ion Beam Secondary Ion Mass Spectrometry", T. Sakamoto, M. Owari, and Y. Nihei, Jpn. J. Appl. Phys. 36, 1287-1291 (1997).

  7. "Individual particle analysis of nonmetallic inclusion in steel by Ga+ focusedion beam SIMS ", B.Tomiyasu,T.Shibata,M.Owari and Y.Nihei, Secondary Ion Mass Spectrometry SIMS X, eds. A. Benninghoven, B. Hagenhoff and H. W. Werner, (JOHN WILEY & SONS, Chichester, 1997) p.177-180.

  8. "Individual Particle Analysis of Suspended Particulate Matter by Ga+ Focused Ion Beam SIMS and Electron Probe Microanalysis ", T. Sakamoto, B. Tomiyasu, K. Katsumata, M. Owari, N. Jingu and Y. Nihei, Secondary Ion Mass Spectrometry SIMS X, eds. A. Benninghoven, B. Hagenhoff and H. W. Werner, (JOHN WILEY & SONS, Chichester, 1997) p.185-189.

1996

  1. "Comparison between suspended particulate matter of urban sites in Jakarta andTokyo using portable sampler and electron probe microanalysis", B. Tomiyasu, Y. Hasegawa, M. Kanayama, M. Owari and Y. Nihei, ECASIA '95, eds. H. J. Mathieu, B. Reihl and D. Briggs, (JOHN WILEY & SONS, Chichester, 1996) p.369-372.

  2. "Simulation of Erosion of a Particle by Ion Bombardment", T. Sakamoto, B. Tomiyasu, M. Owari and Y. Nihei, ECASIA '95, eds. H. J. Mathieu, B. Reihl and D. Briggs, (JOHN WILEY & SONS, Chichester, 1996) p.639-642.

  3. "Same particle analysis of suspended particulate matter by electron probe microanalysis and secondary ion mass spectroscopy ", T. Sakamoto, B. Tomiyasu, N. Jingu, M. Owari and Y. Nihei, Bunseki Kagaku, 45(6), 479-484 (1996) (in Japanese).

  4. "Chracterization of nonmetallic inclusions in aluminium-deoxidized and titanium-denitrified low carbon steel using submicron SIMS ", B. Tomiyasu, T. Sakamoto, N. Jingu, M. Owari and Y. Nihei, Bunseki Kagaku, 45(6), 485-492 (1996) (in Japanese).

  5. "Site-specific Character of the Kikuchi-Like Bands in High-Angular-Resolution X-ray Photoelectron Diffraction ", Y. Ichinohe, H. Ishii, M. Owari and Y. Nihei, Jpn. J. Appl. Phys. 35, L587-L580 (1996)

1995

  1. "Individual Analysis of Nonmetallic Inclusions in Steel by Using the Gallium Focused Ion Beam Secondary Ion Mass Spectrometry ", B. Tomiyasu, A. Inami, M. Abe and Y. Nihei, Tetsu to Hagane, 81(10), 977-982 (1995) (in Japanese).

  2. "Auger Electron Diffraction Pattern from MgO(001) obtained at High Angular Resolution.", Y. Ichinohe, H. Ishii, M. Owari and Y. Nihei, J. Vac. Sci. Technol. A13, 1489-1492(1995) .

1994

  1. "Ambient Oxygen Effect in Ga+ FIB-SIMS.", T. Sakamoto, B. Tomiyasu, M. Owari and Y. Nihei, Surf. Interface Anal., 22, 106-110 (1994).

  2. "Measurements and Model Calculation of Ambient Oxygen Effect on Secondary Ion Enhancement in Gallium Focused Ion Beam SIMS", T. Sakamoto, B. Tomiyasu, N. Mie, M. Owari and Y. Nihei, Secondary Ion Mass Spectrometry SIMS IX, eds. A. Benninghoven, Y. Nihei, R. Shimizu and H. W. Werner, (JOHN WILEY & SONS, Chichester, 1994) p.53-56.

  3. "Micro Cross-Sectioning and Quantitative Estimation of Internal Vacancy of Inorganic Microcapsules by Gallium Focused Ion Beam SIMS", B. Tomiyasu, M. Owari and Y. Nihei, Secondary Ion Mass Spectrometry SIMS IX, eds. A. Benninghoven, Y. Nihei, R. Shimizu and H. W. Werner, (JOHN WILEY & SONS, Chichester, 1994) p.565-568.

  4. "Electron Probe Micro Analysis (EDS-EPMA) and Secondary Ion Mass Spectrometry (SIMS) of Finger Nail Melanonychia", Y. Hoshika, B. Tomiyasu, Y. Nihei and M. Owari, Secondary Ion Mass Spectrometry SIMS IX, eds. A. Benninghoven, Y. Nihei, R. Shimizu and H. W. Werner, (JOHN WILEY & SONS, Chichester, 1994) p.832-835.

  5. "Detrmination of Carbon in Inorganic Micro Particles by Gallium Focused Ion Beam SIMS", B. Tomiyasu, N. Mie, M. Owari and Y. Nihei, Secondary Ion Mass Spectrometry SIMS IX, eds. A. Benninghoven, Y. Nihei, R. Shimizu and H. W. Werner, (JOHN WILEY & SONS, Chichester, 1994) p.848-851.

  6. "Secondary Ion Mass Spectrometry SIMS IX", eds. A. Benninghoven, Y. Nihei, R. Shimizu and H. W. Werner, (JOHN WILEY & SONS, Chichester, 1994).



(Last Update : May 19, 1998)

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