A challenge to the chemical analysis of a single atom with scanning probe microscope
Hiroshi Tokumoto
Joint Research Center for Atom Technology (JRCAT),
National Institute of Advanced Industrial Science and Technology (AIST)
AIST Central 4, Higashi 1-1-1, Tsukuba Ibaraki 305-8562, Japan
We have been trying to establish technologies to identify chemical species of atoms and molecules using scanning probe technology (SPM). Among several possible techniques, we have combined SPM with mass spectrometer (SPM/FIM/AP), magnetic force control (MFC-AFM), low temperature technology, and ultra-high sensitivity near-field vibrational spectroscopy (SNOM/Raman), and so on. In this talk, I will show a couple of them stressing on their instrumentation and demonstrative results. These works have been carried out in collaboration with T. Shimizu, A. Bruckbauer, M. Futamata, S.P. Jarvis, M. Kageshima, N. Choi, and T. Uchihashi at JRCAT under the support by NEDO.