Fourier transform near-field IR spectroscopy

Yoshihito Narita and Shigeyuki Kimura

JASCO Corporation
2967-5, Ishikawa-cho, Hachioji-shi, Tokyo 192-8537, Japan

We propose new systems which combine a Fourier transform spectrometer with near-field microscopes to achieve sub-wavelength spatial resolution for Near IR to IR spectroscopy. We report first near-field FT/IR mapping spectra for a semiconductor
photoluminescence and a contamination grain (2.5 micrometer in diameter) on a mirror. The latter result shows that -CH distributes at the center of the grain whereas -OH distributes at the edge of the grain. The spatial resolution of the measurement is less than 1 micrometer in both case.