MICROSCALE AND NANOSCALE CHARACTERISATION OF MATERIALS USING A MODIFIED SCANNING FORCE MICROSCOPE

L.McDonnell

Cork Institute of Technology
Rossa Avenue, Cork, Ireland.

A commercial scanning force microsope of the scanned cantilever type has been modified to enable a range of material properties to be characterised. The instrument has been adapted to use metallic foil cantilevers that carry diamond tips. Custom software has been written to enable a number of characterisation tests to be performed. These tests include indentation, coating adhesion and wear. Images of the material surface before and after testing are made using the diamond tip in contact mode for hard samples and profile mode for soft samples. Results from a range of materials are presented.