SPM STUDIES OF THE ELECTRIFIED SOLID-LIQUID INTERFACE

Andrew A. Gewirth

Department of Chemistry, University of Illinois,
600 S. Mathews Avenue, Urbana, IL 61801

Scanning Probe Microscopy is an important research tool useful in studying structure and reactivity at surfaces, especially those immersed in solution and under potential control. The STM and AFM are used not only to image evolving structures, both at the micron and nanometer scale, but also to examine the composition and tribological properties of the evolving interface by taking advantage of specific interactions between the tip and the surface. Specific measurements directed at discerning the structure of solvents at the electrified interface will be discussed.